Dielectric properties study of surface engineered nano TiO 2 /epoxy composites

Sasidhar Siddabattuni, Sri Harsha Akella, Abilash Gangula, Sivakumar Belliraj, L. A.Avinash Chunduri

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Nanodielectrics are promising materials that can efficiently store a large amount of electrical energy that are desirable for many electronic and power devices. Control of polymer–particle interface in nanodielectrics is very critical in not only obtaining the improved quality of dispersion but also in altering the dielectric properties. Various surface modifying agents with linear (alkyl), aromatic (phenyl) and extended aromatic (naphthyl) chemical nature were employed at the epoxy–nanoTiO 2 interface. All the surface-modifying agents were successful in passivating the nanoparticles surface and in obtaining the improved quality of polymer–particle dispersion and improved glass transition temperature comparatively. However, all the surface modifiers were not successful in obtaining the improved dielectric properties of the nanodielectrics, especially dielectric breakdown resistance. Only the extended aromatic group at the polymer–particle interface, which is more electron withdrawing in electronic nature than phenyl and alkyl structures, was successful in improving the dielectric breakdown resistance. Thus, the choice of surface-modifying agent based on its chemical and electronic nature is very important in optimizing the dielectric properties of nanodielectrics. Naphthyl phosphate-modified nanoTiO 2–epoxy composite films of ∼ 90–100 μ m thick at 5 vol% particle concentration yielded higher dielectric breakdown resistance than pure epoxy polymer and thereby resulted in about 90% higher electrical energy storage density than the pure epoxy film.

Original languageEnglish
Article number13
JournalBulletin of Materials Science
Volume41
Issue number1
DOIs
StatePublished - 1 Feb 2018
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2018, Indian Academy of Sciences.

Funding

This work was made possible by the funds provided by the DST-SERB Start-Up research grant for young scientists (No. SB/FT/CS-019/2012), Government of India. We would like to acknowledge the micro and nano characterization facility of the centre for nano science and engineering and the materials research centre, Indian Institute of Science, Bangalore, for providing XPS, FE-SEM and nanodielectrics impedance characterizations.

FundersFunder number
DST-SERBSB/FT/CS-019/2012

    Keywords

    • Nanodielectrics
    • dielectric breakdown strength
    • electron-withdrawing
    • energy density
    • interface
    • organophosphate

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