Abstract
The atomic structure of a new ternary U2FeAl20 phase appearing in the Al-rich corner of a U-Fe-Al system was solved using electron crystallography and X-ray powder diffraction techniques (XRD). The positions of U atoms were determined from crystallographically processed high-resolution electron microscopy (HRTEM) images. These positions were used as a starting set for determining the coordinates of Fe and Al atoms by difference-Fourier synthesis technique. The U2FeAl20 phase is tetragonal and belongs to the I over(4, ̄) 2 m space group. Its unit cell contains 80 Al, 4 Fe, and 8 U atoms. The lattice parameters obtained after Rietveld refinement are: a = 12.4138 Å, c = 10.3014 Å. The reliability factors characterizing the Rietveld refinement procedure are: Rp = 8.65%, Rwp = 11.2% and Rb = 5.93%.
| Original language | English |
|---|---|
| Pages (from-to) | 196-200 |
| Number of pages | 5 |
| Journal | Journal of Alloys and Compounds |
| Volume | 460 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 28 Jul 2008 |
| Externally published | Yes |
Keywords
- Crystal structure
- Intermetallics
- TEM
- Transmission electron microscopy
- X-ray diffraction
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