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DETERMINATION OF THE NATURE OF DISTRIBUTION OF IMPURITIES BY MEASURING THE DC HOPPING CONDUCTIVITY.

  • A. R. Gadzhiev
  • , I. S. Shlimak

Research output: Contribution to journalArticlepeer-review

Abstract

The considerable capabilities of the dc hopping conductivity measurements as a method for investigating the nature of the microscopic distribution of impurities are demonstrated for p-type Ge doped with gallium.

Original languageEnglish
Pages (from-to)120-121
Number of pages2
JournalSoviet physics. Semiconductors
Volume8
Issue number1
StatePublished - 1974

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