Abstract
Theoretical and experimental investigations of the time dependence of the effective thickness and shift of the boundary of beaded thin films are presented, supposing evaporation or diffusion into the substrate. In addition to evaporation and (bulk and surface) diffusion, the role of boundary reactions at the perimeter of beads as well as at the surface layer-bulk interface are taken into account. It is shown that the time dependence of the effective thickness and shift of the boundary is different for diffusion-interacting ensembles and for isolated particles, and is determined also by the relative magnitudes of the diffusion and interface reaction currents. Our paper has a review character in the sense that all special cases treated before by different theoretical models can be obtained as limiting cases from our theory. Furthermore, the description of the time dependence of the shift of the boundary for diffusion dissolution is original. Using the example of Cu beaded films on Mo as well as Ag on alumina surfaces, it is illustrated that from simultaneous experimental measurements of the effective thickness and the shift of the beaded film one can determine all the parameters controlling the surface mass transfer.
Original language | English |
---|---|
Pages (from-to) | 185-199 |
Number of pages | 15 |
Journal | Materials Science and Engineering B |
Volume | 32 |
Issue number | 3 |
DOIs | |
State | Published - Jul 1995 |
Externally published | Yes |
Bibliographical note
Funding Information:One of us (Yu.S. Kaganovskii) is grateful to the Kereskedelmi Bank Rt. Unlversitas Foundation for financial support of his stay at the L. Kossuth University, Debrecen. Furthermore the authors are very indebted to their colleagues at Debrecen (Dr. G. Erd61yi, I. Beszeda, M. Bark6czy, Zs. T6kei) Kharkov (S.P. Yurchenko) and in Marseilles at Laboratoire de Metallurgie, Universitd St. Jerome (Drs. E. Moya, B. Aufray as well as H. Giordano), for participation in the measurements, the results of which were used in our paper. This work was partly supported by the Hungarian Ministry of Education under contract MKM 1993K+E
Funding
One of us (Yu.S. Kaganovskii) is grateful to the Kereskedelmi Bank Rt. Unlversitas Foundation for financial support of his stay at the L. Kossuth University, Debrecen. Furthermore the authors are very indebted to their colleagues at Debrecen (Dr. G. Erd61yi, I. Beszeda, M. Bark6czy, Zs. T6kei) Kharkov (S.P. Yurchenko) and in Marseilles at Laboratoire de Metallurgie, Universitd St. Jerome (Drs. E. Moya, B. Aufray as well as H. Giordano), for participation in the measurements, the results of which were used in our paper. This work was partly supported by the Hungarian Ministry of Education under contract MKM 1993K+E
Funders | Funder number |
---|---|
Hungarian Ministry of Education | MKM 1993K+E |
Unlversitas Foundation |
Keywords
- Auger electron microscopy
- Electron microscopy
- Surface diffusion
- Thin films