TY - JOUR
T1 - Detection of refractive index and imperfection in thin film transparent polymer by back focal plane imaging
AU - Kilmovsky, Hodaya
AU - Shavit, Omer
AU - Oheim, Martin
AU - Salomon, Adi
N1 - Publisher Copyright:
© The Authors, published by EDP Sciences.
PY - 2024/10/31
Y1 - 2024/10/31
N2 - Emission patterns from molecules at interfaces encode many details about their local environment and their axial position, along the microscope's optical axis. We introduce an advanced approach that synergizes back focal plane (BFP) imaging with innovative 'smart' surfaces make surface imaging more qualitative, more reliable, and more robust. Our method is particularly focused on accurately measuring the refractive index (Rl) of transparent thin films and their imperfections close to the interfaces. Our technique utilizes a 'smart' surface, which features a uniform fluorescent thin film of about 4 nm thickness together with back-focal plane (BFP) imaging. We manage to detect bubbles or other imperfection in 100 nm thin film of polymer with Rl of 1.34.
AB - Emission patterns from molecules at interfaces encode many details about their local environment and their axial position, along the microscope's optical axis. We introduce an advanced approach that synergizes back focal plane (BFP) imaging with innovative 'smart' surfaces make surface imaging more qualitative, more reliable, and more robust. Our method is particularly focused on accurately measuring the refractive index (Rl) of transparent thin films and their imperfections close to the interfaces. Our technique utilizes a 'smart' surface, which features a uniform fluorescent thin film of about 4 nm thickness together with back-focal plane (BFP) imaging. We manage to detect bubbles or other imperfection in 100 nm thin film of polymer with Rl of 1.34.
UR - http://www.scopus.com/inward/record.url?scp=85212483629&partnerID=8YFLogxK
U2 - 10.1051/epjconf/202430902007
DO - 10.1051/epjconf/202430902007
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AN - SCOPUS:85212483629
SN - 2101-6275
VL - 309
JO - EPJ Web of Conferences
JF - EPJ Web of Conferences
M1 - 02007
T2 - 2024 EOS Annual Meeting, EOSAM 2024
Y2 - 9 September 2024 through 13 September 2024
ER -