Detection of refractive index and imperfection in thin film transparent polymer by back focal plane imaging

Hodaya Kilmovsky, Omer Shavit, Martin Oheim, Adi Salomon

Research output: Contribution to journalConference articlepeer-review

Abstract

Emission patterns from molecules at interfaces encode many details about their local environment and their axial position, along the microscope's optical axis. We introduce an advanced approach that synergizes back focal plane (BFP) imaging with innovative 'smart' surfaces make surface imaging more qualitative, more reliable, and more robust. Our method is particularly focused on accurately measuring the refractive index (Rl) of transparent thin films and their imperfections close to the interfaces. Our technique utilizes a 'smart' surface, which features a uniform fluorescent thin film of about 4 nm thickness together with back-focal plane (BFP) imaging. We manage to detect bubbles or other imperfection in 100 nm thin film of polymer with Rl of 1.34.

Original languageEnglish
Article number02007
JournalEPJ Web of Conferences
Volume309
DOIs
StatePublished - 31 Oct 2024
Event2024 EOS Annual Meeting, EOSAM 2024 - Naples, Italy
Duration: 9 Sep 202413 Sep 2024

Bibliographical note

Publisher Copyright:
© The Authors, published by EDP Sciences.

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