Detection and Correction of Malicious and Natural Faults

O. Keren, B. Karp, M. Gay, I. Polian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageAmerican English
Title of host publicationThe 7th International Workshop on Security Proofs for Embedded Systems (PROOFS)
StatePublished - 2018

Bibliographical note

Place of conference:Amsterdam

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