Abstract
We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution.
Original language | English |
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Pages (from-to) | 4130-4134 |
Number of pages | 5 |
Journal | Review of Scientific Instruments |
Volume | 66 |
Issue number | 8 |
DOIs | |
State | Published - 1995 |
Externally published | Yes |