Design and Fundamental Limits of Nearfield Magnetic-Force Scanning Microscopy via the No-Cloning Theorem

Jonathan Nemirovsky, Chen Mechel, Eliahu Cohen, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We analyze nearfield measurements of magnetic fields originating from quantum sources and measured by quantum probes. We show that cloning-inspired techniques reveal optimal measurement schemes and new universal precision bounds for nearfield detectors.

Original languageEnglish
Title of host publication2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580767
StatePublished - May 2020
Event2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States
Duration: 10 May 202015 May 2020

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2020-May
ISSN (Print)1092-8081

Conference

Conference2020 Conference on Lasers and Electro-Optics, CLEO 2020
Country/TerritoryUnited States
CitySan Jose
Period10/05/2015/05/20

Bibliographical note

Publisher Copyright:
© 2020 OSA.

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