Deposition and characterization of Eu:Y2O3 red phosphor thin films

S. L. Jones; D. Kumar; Rajiv K. Singh; P. H. Holloway

doi:10.1557/proc-471-299

Deposition and characterization of Eu:Y₂O₃ red phosphor thin films

S. L. Jones
, D. Kumar
, Rajiv K. Singh
, P. H. Holloway

University of Florida

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y₂O₃ phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y₂O₃ films with 70% brightness compared to powder materials.

Original language	English
Pages (from-to)	299-304
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	471
DOIs	https://doi.org/10.1557/proc-471-299
State	Published - 1997
Externally published	Yes
Event	Proceedings of the 1997 MRS Spring Meeting - San Francisco, CA, USA Duration: 31 Mar 1997 → …

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title = "Deposition and characterization of Eu:Y2O3 red phosphor thin films",

abstract = "Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y2O3 phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y2O3 films with 70\% brightness compared to powder materials.",

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year = "1997",

doi = "10.1557/proc-471-299",

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AU - Jones, S. L.

AU - Kumar, D.

AU - Singh, Rajiv K.

AU - Holloway, P. H.

PY - 1997

Y1 - 1997

N2 - Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y2O3 phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y2O3 films with 70% brightness compared to powder materials.

AB - Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y2O3 phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y2O3 films with 70% brightness compared to powder materials.

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SN - 0272-9172

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JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1997 MRS Spring Meeting

Y2 - 31 March 1997

ER -

Deposition and characterization of Eu:Y₂O₃ red phosphor thin films

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