Deposition and characterization of Eu:Y2O3 red phosphor thin films

S. L. Jones, D. Kumar, Rajiv K. Singh, P. H. Holloway

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


Thin film phosphors are very promising for the fabrication of flat panel field emission displays (FEDs). In the present paper we have reported the growth and characterization of Eu:Y2O3 phosphor thin films. The effect of surface roughness and crystallinity on the brightness of phosphor films have been studied. A post annealing treatment of the films have been found to result in the realization of Eu:Y2O3 films with 70% brightness compared to powder materials.

Original languageEnglish
Pages (from-to)299-304
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 MRS Spring Meeting - San Francisco, CA, USA
Duration: 31 Mar 1997 → …


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