Defect-assisted sub-bandgap avalanche photodetection in interleaved carrier-depletion silicon waveguide for telecom band

Boris Desiatov, Ilya Goykhman, Joseph Shappir, Uriel Levy

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We experimentally demonstrate avalanche sub bandgap detection of light at 1550 nm wavelength via surface states using the configuration of interleaved PN junctions along a silicon waveguide. The device operates in a fully depleted mode.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2014
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529992, 9781557529992
DOIs
StatePublished - 2014
Externally publishedYes
EventCLEO: Science and Innovations, CLEO_SI 2014 - San Jose, CA, United States
Duration: 8 Jun 201413 Jun 2014

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Science and Innovations, CLEO_SI 2014
Country/TerritoryUnited States
CitySan Jose, CA
Period8/06/1413/06/14

Fingerprint

Dive into the research topics of 'Defect-assisted sub-bandgap avalanche photodetection in interleaved carrier-depletion silicon waveguide for telecom band'. Together they form a unique fingerprint.

Cite this