Critical current density measurements in high tc “insitu” YBa2Cu3O7.δ superconducting thin films

C. B. Lee; R. K. Singh; P. Tiwari; J. Narayan

doi:10.1117/12.963979

Critical current density measurements in high tc “insitu” YBa₂Cu₃O_7.δ superconducting thin films

C. B. Lee, R. K. Singh, P. Tiwari, J. Narayan

North Carolina State University

Research output: Contribution to journal › Article › peer-review

Abstract

Critical current density measurements have been made on in-situ processed and patterned, laser deposited thin films. These films were deposited on LaAlO₃ and KTaO₃ with substrate temperatures ranging at from 500-650°C. Epitaxial growth was achieved as targets of Y (123) and Y (123) Ag3 were ablated by an excimer laser in an oxygen ambient atmosphere. A steel mask was placed near the substrate to pattern the films. Transport critical current density was measured as a function of temperature in order to ascertain any role flux pinning may play in determining critical current density.

Original language	English
Pages (from-to)	69-76
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1190
DOIs	https://doi.org/10.1117/12.963979
State	Published - 23 Feb 1990
Externally published	Yes

Funding

Part of this research is sponsored by National Science Foundation project No. MSM-8818994.

Funders	Funder number
National Science Foundation	MSM-8818994

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Critical current density measurements in high tc “insitu” YBa₂Cu₃O_7.δ superconducting thin films

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