TY - GEN
T1 - Complexity of elastic modes of a chaotic silicon wafer
AU - Xéridat, O.
AU - Sebbah, P.
PY - 2009
Y1 - 2009
N2 - We report non invasive measurements of the complex field of elastic modes of a silicon wafer with chaotic shape. The amplitude and phase spatial distribution of the modes are directly obtained by Fourier transform of time measurements. We investigate the crossover of the wavefunction from real to complex, when absorption is progressively increased on one edge of the wafer. The complexity factor, which characterizes the degree to which a wavefunction is complex-valued, is measured for non-overlapping modes and is found to be proportional to the non-homogeneous contribution to the line broadening of the mode.
AB - We report non invasive measurements of the complex field of elastic modes of a silicon wafer with chaotic shape. The amplitude and phase spatial distribution of the modes are directly obtained by Fourier transform of time measurements. We investigate the crossover of the wavefunction from real to complex, when absorption is progressively increased on one edge of the wafer. The complexity factor, which characterizes the degree to which a wavefunction is complex-valued, is measured for non-overlapping modes and is found to be proportional to the non-homogeneous contribution to the line broadening of the mode.
UR - http://www.scopus.com/inward/record.url?scp=84871400707&partnerID=8YFLogxK
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AN - SCOPUS:84871400707
SN - 9781615677368
T3 - 16th International Congress on Sound and Vibration 2009, ICSV 2009
SP - 1703
EP - 1709
BT - 16th International Congress on Sound and Vibration 2009, ICSV 2009
T2 - 16th International Congress on Sound and Vibration 2009, ICSV 2009
Y2 - 5 July 2009 through 9 July 2009
ER -