Characterization techniques: Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes

Research output: Contribution to journal › Review article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	321-323
Number of pages	3
Journal	Current Opinion in Solid State and Materials Science
Volume	4
Issue number	4
DOIs	https://doi.org/10.1016/s1359-0286(99)00042-x
State	Published - Aug 1999
Externally published	Yes

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title = "Characterization techniques: Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes",

author = "Stern, \{Edward A.\} and Siegel, \{Richard W.\}",

year = "1999",

month = aug,

doi = "10.1016/s1359-0286(99)00042-x",

language = "אנגלית",

volume = "4",

pages = "321--323",

journal = "Current Opinion in Solid State and Materials Science",

issn = "1359-0286",

publisher = "Elsevier Ltd.",

number = "4",

}

TY - JOUR

T1 - Characterization techniques

T2 - Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes

AU - Stern, Edward A.

AU - Siegel, Richard W.

PY - 1999/8

Y1 - 1999/8

UR - https://www.scopus.com/pages/publications/0040317076

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DO - 10.1016/s1359-0286(99)00042-x

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AN - SCOPUS:0040317076

SN - 1359-0286

VL - 4

SP - 321

EP - 323

JO - Current Opinion in Solid State and Materials Science

JF - Current Opinion in Solid State and Materials Science

IS - 4

ER -