Characterization techniques: Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes

Edward A. Stern, Richard W. Siegel

Research output: Contribution to journalReview articlepeer-review

2 Scopus citations
Original languageEnglish
Pages (from-to)321-323
Number of pages3
JournalCurrent Opinion in Solid State and Materials Science
Issue number4
StatePublished - Aug 1999
Externally publishedYes

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