Characterization techniques: Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes

Edward A. Stern, Richard W. Siegel

Research output: Contribution to journal › Review article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	321-323
Number of pages	3
Journal	Current Opinion in Solid State and Materials Science
Volume	4
Issue number	4
DOIs	https://doi.org/10.1016/s1359-0286(99)00042-x
State	Published - Aug 1999
Externally published	Yes

Access to Document

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title = "Characterization techniques: Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes",

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AU - Siegel, Richard W.

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