Characterization of X-ray induced damage in alkanethiolate monolayers by high-resolution photoelectron spectroscopy

Keyphrases

• High-resolution 100%
• Photoelectron Spectroscopy 100%
• X-ray Damage 100%
• Alkanethiol 100%
• Alkanethiolates 100%
• Sulfur Species 66%
• Irradiation 66%
• X-ray Photoelectron Spectroscopy 33%
• Self-assembled Monolayer 33%
• X-ray Irradiation 33%
• Soft X-ray 33%
• Photoelectron 33%
• Adlayer 33%
• Secondary Electron 33%
• Synchrotron Techniques 33%
• Undulator Beamline 33%
• Alkanethiol Self-assembled Monolayers 33%
• Electron Bombardment 33%
• Dialkyl Sulfides 33%

Physics

• High Resolution 100%
• Photoelectron Spectroscopy 100%
• X Ray Spectroscopy 50%
• Synchrotron 50%
• Photoelectron 50%
• Beamline 50%
• Undulator 50%
• X Ray Irradiation 50%
• Electron Bombardment 50%