Characterization of the magnetic anisotropy in thin films of La1–xSrxMnO3 using the planar Hall effect

Y Bason, L. Klein, JB Yau, X Hong, CH Ahn

Research output: Contribution to journalArticlepeer-review

Abstract

Thin films of the colossal magnetoresistance material La1–xSrxMnO3 (LSMO) grown on SrTiO3 substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [1equation image0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy.
Original languageAmerican English
Pages (from-to)3336-3338
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume1
Issue number12
StatePublished - 2004

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