Characterization of the magnetic anisotropy in thin films of La 1-xSrxMnO3 using the planar Hall effect

Y. Bason; L. Klein; J. B. Yau; X. Hong; C. H. Ahn

doi:10.1002/pssc.200405450

Characterization of the magnetic anisotropy in thin films of La _1-xSr_xMnO₃ using the planar Hall effect

Y. Bason, L. Klein, J. B. Yau, X. Hong, C. H. Ahn

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Thin films of the colossal magnetoresistance material La _1-xSr_xMnO₃ (LSMO) grown on SrTiO₃ substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [11̄0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy.

Original language	English
Pages (from-to)	3336-3338
Number of pages	3
Journal	Physica Status Solidi C: Conferences
Volume	1
Issue number	12
DOIs	https://doi.org/10.1002/pssc.200405450
State	Published - 2004

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abstract = "Thin films of the colossal magnetoresistance material La 1-xSrxMnO3 (LSMO) grown on SrTiO3 substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [1{\=1}0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy.",

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AU - Hong, X.

AU - Ahn, C. H.

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N2 - Thin films of the colossal magnetoresistance material La 1-xSrxMnO3 (LSMO) grown on SrTiO3 substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [11̄0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy.

AB - Thin films of the colossal magnetoresistance material La 1-xSrxMnO3 (LSMO) grown on SrTiO3 substrates exhibit bi-axial magnetocrystalline anisotropy with easy axes along the [110] and [11̄0] directions. We have recently discovered that the intrinsic biaxial magnetic anisotropy combined with a giant planar Hall effect lead to striking switching behavior in the transverse resistivity of LSMO films (Appl. Phys. Lett. 84, 2593 (2004)). Here we use this phenomenon as a sensitive tool for measuring in-plane magnetization in order to characterize the magnetic anisotropy.

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Characterization of the magnetic anisotropy in thin films of La _1-xSr_xMnO₃ using the planar Hall effect

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