Characterization of Nanometric Thin Films with Far-Field Light

  • Hodaya Klimovsky
  • , Omer Shavit
  • , Carine Julien
  • , Ilya Olevsko
  • , Mohamed Hamode
  • , Yossi Abulafia
  • , Hervé Suaudeau
  • , Vincent Armand
  • , Martin Oheim
  • , Adi Salomon

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

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Keyphrases

Engineering

Material Science