Characterization of Monolithic n-Type 6H-SiC Piezoresistive Sensing Elements

Joseph S. Shor, Leala Bemis, Anthony D. Kurtz

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74 Scopus citations

Abstract

Monolithic, junction isolated piezoresistors have been fabricated in commercially available 6H-SiC. The gauge factor (GF) of these elements has been measured up to 250° C in both longitudinal and transverse configurations. The maximum GF observed was —29.4, corresponding to the piezoresistive coefficient π11. A beam transducer with a four-arm integral piezoresistor network was fabricated and tested in a force sensor configuration. The data indicate that n-type 6H-SiC has the potential to be useful in high temperature electromechanical sensors to measure parameters such as pressure, force, strain and acceleration.

Original languageEnglish
Pages (from-to)661-665
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume41
Issue number5
DOIs
StatePublished - May 1994
Externally publishedYes

Bibliographical note

Funding Information:
Manuscript received June 23, 1993; revised December I, 1993. The review of this paper was arranged by Associate Editor S. D. Senturia. This work was supported by the NASA Lewis Phase I SBIR program under the management of Lawrence G. Matus. The authors are with Kulite Semiconductor Products, Inc., Leonia, NJ 07605, USA. IEEE Log Number 9400010.

Funding

Manuscript received June 23, 1993; revised December I, 1993. The review of this paper was arranged by Associate Editor S. D. Senturia. This work was supported by the NASA Lewis Phase I SBIR program under the management of Lawrence G. Matus. The authors are with Kulite Semiconductor Products, Inc., Leonia, NJ 07605, USA. IEEE Log Number 9400010.

FundersFunder number
National Aeronautics and Space Administration

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