Characteristics of granular Al-Al2O3 SQUIDs

D. Abraham; G. Deutscher; R. Rosenbaum; S. Wolf

doi:10.1007/BF00056663

Characteristics of granular Al-Al₂O₃ SQUIDs

D. Abraham, G. Deutscher, R. Rosenbaum, S. Wolf

Research output: Contribution to journal › Article › peer-review

Abstract

SQUIDs employing microbridges of large cross-sectional areas have been constructed from granular superconducting Al-Al₂O₃ films. Films having high normal-state resistivities were used for their low values of critical current densities. Although the penetration depth in such films is large compared with their thickness, we find that the flux is still quantized in units of Φ₀ and that the noise level is close to intrinsic as calculated by Jackel and Buhrman. It is only for very large values of the penetration depth (λ > 10Μm) that the signal-to-noise ratio is expected to deteriorate.

Original language	English
Pages (from-to)	853-867
Number of pages	15
Journal	Journal of Low Temperature Physics
Volume	32
Issue number	5-6
DOIs	https://doi.org/10.1007/BF00056663
State	Published - Sep 1978
Externally published	Yes

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abstract = "SQUIDs employing microbridges of large cross-sectional areas have been constructed from granular superconducting Al-Al2O3 films. Films having high normal-state resistivities were used for their low values of critical current densities. Although the penetration depth in such films is large compared with their thickness, we find that the flux is still quantized in units of Φ0 and that the noise level is close to intrinsic as calculated by Jackel and Buhrman. It is only for very large values of the penetration depth (λ > 10Μm) that the signal-to-noise ratio is expected to deteriorate.",

author = "D. Abraham and G. Deutscher and R. Rosenbaum and S. Wolf",

year = "1978",

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AU - Rosenbaum, R.

AU - Wolf, S.

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AB - SQUIDs employing microbridges of large cross-sectional areas have been constructed from granular superconducting Al-Al2O3 films. Films having high normal-state resistivities were used for their low values of critical current densities. Although the penetration depth in such films is large compared with their thickness, we find that the flux is still quantized in units of Φ0 and that the noise level is close to intrinsic as calculated by Jackel and Buhrman. It is only for very large values of the penetration depth (λ > 10Μm) that the signal-to-noise ratio is expected to deteriorate.

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Characteristics of granular Al-Al₂O₃ SQUIDs

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