CC2TIG: Dynamic C2MOS Design Based on Three-Independent-Gate Field-Effect Transistors

Daniel Vana; Pierre Emmanuel Gaillardon; Adam Teman

doi:10.1109/TNANO.2020.2965119

CC²TIG: Dynamic C²MOS Design Based on Three-Independent-Gate Field-Effect Transistors

Daniel Vana, Pierre Emmanuel Gaillardon, Adam Teman

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Dynamic logic has become a niche approach in circuit design, mainly due to the reliability limitations that have been aggravated with process down-scaling. To that extent, the performance and area benefits of dynamic design approaches, such as the integration of the Clocked CMOS (C²MOS) approach, are left on the table. In this article, we propose employing the Three-Independent-Gate Field-Effect Transistor (TIGFET) technology for the implementation of the C²MOS approach, which we call the Clocked Complementary TIG (C²TIG) approach. Electrical simulations at 22nm demonstrate the enhanced robustness of the C²TIG approach, while providing gains in power, performance, and area. Finally, new design opportunities for synchronous systems are demonstrated with the C²TIG approach.

Original language	English
Article number	8959396
Pages (from-to)	123-136
Number of pages	14
Journal	IEEE Transactions on Nanotechnology
Volume	19
DOIs	https://doi.org/10.1109/TNANO.2020.2965119
State	Published - 2020

Bibliographical note

Publisher Copyright:
© 2002-2012 IEEE.

Funding

Manuscript received November 4, 2019; accepted January 4, 2020. Date of publication January 14, 2020; date of current version January 20, 2020. This work was kindly supported by the Israel Science Fund under grant number 996/18. The review of this article was arranged by Associate Editor Dr. M. Niemier. (Corresponding author: Daniel Vana.) D. Vana is with the School of Electrical Engineering, Tel-Aviv University, Tel Aviv-Yafo 69978, Israel (e-mail: [email protected]).

Funders	Funder number
israel science fund	996/18

Keywords

Field effect transistors
integrated circuit reliability
integrated circuit technology
nanoscale devices
sequential circuits

Access to Document

10.1109/TNANO.2020.2965119

Cite this

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abstract = "Dynamic logic has become a niche approach in circuit design, mainly due to the reliability limitations that have been aggravated with process down-scaling. To that extent, the performance and area benefits of dynamic design approaches, such as the integration of the Clocked CMOS (C2MOS) approach, are left on the table. In this article, we propose employing the Three-Independent-Gate Field-Effect Transistor (TIGFET) technology for the implementation of the C2MOS approach, which we call the Clocked Complementary TIG (C2TIG) approach. Electrical simulations at 22nm demonstrate the enhanced robustness of the C2TIG approach, while providing gains in power, performance, and area. Finally, new design opportunities for synchronous systems are demonstrated with the C2TIG approach.",

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