CC2TIG: Dynamic C2MOS Design Based on Three-Independent-Gate Field-Effect Transistors

Daniel Vana, Pierre Emmanuel Gaillardon, Adam Teman

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Dynamic logic has become a niche approach in circuit design, mainly due to the reliability limitations that have been aggravated with process down-scaling. To that extent, the performance and area benefits of dynamic design approaches, such as the integration of the Clocked CMOS (C2MOS) approach, are left on the table. In this article, we propose employing the Three-Independent-Gate Field-Effect Transistor (TIGFET) technology for the implementation of the C2MOS approach, which we call the Clocked Complementary TIG (C2TIG) approach. Electrical simulations at 22nm demonstrate the enhanced robustness of the C2TIG approach, while providing gains in power, performance, and area. Finally, new design opportunities for synchronous systems are demonstrated with the C2TIG approach.

Original languageEnglish
Article number8959396
Pages (from-to)123-136
Number of pages14
JournalIEEE Transactions on Nanotechnology
Volume19
DOIs
StatePublished - 2020

Bibliographical note

Publisher Copyright:
© 2002-2012 IEEE.

Keywords

  • Field effect transistors
  • integrated circuit reliability
  • integrated circuit technology
  • nanoscale devices
  • sequential circuits

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