Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy

H. J. Gao; G. Duscher; M. Kim; S. J. Pennycook; D. Kumar; K. G. Cho; R. K. Singh

doi:10.1063/1.127055

Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy

H. J. Gao
, G. Duscher
, M. Kim
, S. J. Pennycook
, D. Kumar
, K. G. Cho
, R. K. Singh

Oak Ridge National Laboratory
CAS - Institute of Physics
University of Florida

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

We report the observation of porous structures in laser-ablation-deposited Y₂O₃:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm "dead layer" around each void, which is responsible for the observed reduction in luminescence efficiency.

Original language	English
Pages (from-to)	594-596
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	4
DOIs	https://doi.org/10.1063/1.127055
State	Published - 24 Jul 2000
Externally published	Yes

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10.1063/1.127055

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title = "Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy",

abstract = "We report the observation of porous structures in laser-ablation-deposited Y2O3:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm {"}dead layer{"} around each void, which is responsible for the observed reduction in luminescence efficiency.",

author = "Gao, \{H. J.\} and G. Duscher and M. Kim and Pennycook, \{S. J.\} and D. Kumar and Cho, \{K. G.\} and Singh, \{R. K.\}",

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AU - Gao, H. J.

AU - Duscher, G.

AU - Kim, M.

AU - Pennycook, S. J.

AU - Kumar, D.

AU - Cho, K. G.

AU - Singh, R. K.

PY - 2000/7/24

Y1 - 2000/7/24

N2 - We report the observation of porous structures in laser-ablation-deposited Y2O3:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm "dead layer" around each void, which is responsible for the observed reduction in luminescence efficiency.

AB - We report the observation of porous structures in laser-ablation-deposited Y2O3:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm "dead layer" around each void, which is responsible for the observed reduction in luminescence efficiency.

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Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy

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