Broadband THz, extended depth of focus imaging based on step phase mask aided interferometry

Assaf Bitman; Inon Moshe; Zeev Zalevsky

doi:10.1016/j.optcom.2013.07.008

Broadband THz, extended depth of focus imaging based on step phase mask aided interferometry

Assaf Bitman, Inon Moshe, Zeev Zalevsky

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

This work describes the realization of an extended depth of field (EDOF) in pulsed THz imaging systems using a step phase mask (SPM) attached to the objective lens. The SPM was designed to generate an EDOF compared to Gaussian broadband sources. This imaging property is demonstrated using a resolution target illuminated by broadband THz beams. An imaging depth improvement factor of 1.5 is demonstrated. In this paper we present the element design method together with numerical and experimental results.

Original language	English
Pages (from-to)	1-5
Number of pages	5
Journal	Optics Communications
Volume	309
DOIs	https://doi.org/10.1016/j.optcom.2013.07.008
State	Published - 2013

Keywords

Coded aperture
EDOF
Imaging
OTF
THz

Access to Document

10.1016/j.optcom.2013.07.008

Cite this

@article{3b2bc4cd4bd14406899c4debb8a63c46,

title = "Broadband THz, extended depth of focus imaging based on step phase mask aided interferometry",

abstract = "This work describes the realization of an extended depth of field (EDOF) in pulsed THz imaging systems using a step phase mask (SPM) attached to the objective lens. The SPM was designed to generate an EDOF compared to Gaussian broadband sources. This imaging property is demonstrated using a resolution target illuminated by broadband THz beams. An imaging depth improvement factor of 1.5 is demonstrated. In this paper we present the element design method together with numerical and experimental results.",

keywords = "Coded aperture, EDOF, Imaging, OTF, THz",

author = "Assaf Bitman and Inon Moshe and Zeev Zalevsky",

year = "2013",

doi = "10.1016/j.optcom.2013.07.008",

language = "אנגלית",

volume = "309",

pages = "1--5",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier",

}

TY - JOUR

T1 - Broadband THz, extended depth of focus imaging based on step phase mask aided interferometry

AU - Bitman, Assaf

AU - Moshe, Inon

AU - Zalevsky, Zeev

PY - 2013

Y1 - 2013

N2 - This work describes the realization of an extended depth of field (EDOF) in pulsed THz imaging systems using a step phase mask (SPM) attached to the objective lens. The SPM was designed to generate an EDOF compared to Gaussian broadband sources. This imaging property is demonstrated using a resolution target illuminated by broadband THz beams. An imaging depth improvement factor of 1.5 is demonstrated. In this paper we present the element design method together with numerical and experimental results.

AB - This work describes the realization of an extended depth of field (EDOF) in pulsed THz imaging systems using a step phase mask (SPM) attached to the objective lens. The SPM was designed to generate an EDOF compared to Gaussian broadband sources. This imaging property is demonstrated using a resolution target illuminated by broadband THz beams. An imaging depth improvement factor of 1.5 is demonstrated. In this paper we present the element design method together with numerical and experimental results.

KW - Coded aperture

KW - EDOF

KW - Imaging

KW - OTF

KW - THz

UR - http://www.scopus.com/inward/record.url?scp=84880658243&partnerID=8YFLogxK

U2 - 10.1016/j.optcom.2013.07.008

DO - 10.1016/j.optcom.2013.07.008

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:84880658243

SN - 0030-4018

VL - 309

SP - 1

EP - 5

JO - Optics Communications

JF - Optics Communications

ER -

Broadband THz, extended depth of focus imaging based on step phase mask aided interferometry

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this