Abstract
A bilayer lift-off process has been employed to fabricate optimal electrode contact geometry for statistical characterization of ultrathin organic thin-film transistors (OTFTs). For over 100 p -channel ultrathin (12 ML) copper phthalocyanine (CuPc) OTFTs, the bilayer photoresist lift-off process increased the field effect mobility by two orders of magnitude, decreased the contact resistance by three orders of magnitude, increased the on/off ratio by one order of magnitude, and the threshold voltage was decreased by a factor of three compared to conventionally processed devices. The generality of the method was validated by fabricating OTFTs in four different phthalocynaines and CuPc OTFTs with eight different channel thicknesses.
Original language | English |
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Article number | 193311 |
Journal | Applied Physics Letters |
Volume | 92 |
Issue number | 19 |
DOIs | |
State | Published - 2008 |
Externally published | Yes |
Bibliographical note
Funding Information:The authors acknowledge financial support for this work from AFOSR Grant No. MURI F49620-02-1-0288 and NSF Grant No. CHE-0350571.
Funding
The authors acknowledge financial support for this work from AFOSR Grant No. MURI F49620-02-1-0288 and NSF Grant No. CHE-0350571.
Funders | Funder number |
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National Science Foundation | CHE-0350571 |
Air Force Office of Scientific Research | MURI F49620-02-1-0288 |