Band gap determination of semiconductor powders via surface photovoltage spectroscopy

Gal Gal, Y. Mastai, G. Hodes, L. Kronik

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Abstract

Surface photovoltage spectroscopy (SPS) is introduced as a powerful tool for band gap determination of semiconductor powders. The main advantage of SPS is that scattering and reflection do not interfere with the spectra. Therefore, it does not suffer from the inherent limitations of transmission/reflection based spectroscopies, most notably diffuse reflectance spectroscopy (DRS). The principles of the approach are presented and its usefulness is demonstrated by comparing it with DRS for band gap determination of GaAs, InP, CdTe, CdSe, and CdS semiconductor powders.

Original languageEnglish
Pages (from-to)5573-5577
Number of pages5
JournalJournal of Applied Physics
Volume86
Issue number10
DOIs
StatePublished - 15 Nov 1999
Externally publishedYes

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