Atomic force microscopy study of the morphology of polythiophene films grafted onto the surface of a Pt microelectrode array

M. D. Levi; Yaron Cohen; Yair Cohen; Doron Aurbach; M. Lapkowski; E. Vieil; J. Serose

doi:10.1016/s0379-6779(99)00198-8

Atomic force microscopy study of the morphology of polythiophene films grafted onto the surface of a Pt microelectrode array

M. D. Levi
, Yaron Cohen
, Yair Cohen
, Doron Aurbach
, M. Lapkowski
, E. Vieil
, J. Serose

Bar-Ilan University
Silesian University of Technology
Commissariat à l’énergie atomique et aux énergies alternatives

Research output: Contribution to journal › Conference article › peer-review

12 Scopus citations

Abstract

This work involves the application of atomic force microscopy (AFM) to the study of the morphology of polythiophene (PT) films grafted onto an array of six-band microelectrodes used for the measurements of in situ electronic conductivity of polymeric films. The following two types of the polymeric film can be distinguished: one film is related to the layer just above the microelectrodes, whereas the other type of film bridges the gap between the two microelectrodes. We have shown that the gaps located in the interior part of the array are completely bridged by the PT film; however, the thickness of the film above the microelectrodes is about one order of magnitude larger than that related to the center of the gap. The Z-profile of the film across the gap has a rounded shape. The lateral (friction) force image taken from both types of the PT films shows that they are similar. The AFM images prove that the PT film possesses mainly a granular-type morphology.

Original language	English
Pages (from-to)	55-65
Number of pages	11
Journal	Synthetic Metals
Volume	109
Issue number	1
DOIs	https://doi.org/10.1016/s0379-6779(99)00198-8
State	Published - 1 Mar 2000
Event	The 18th International Conference on Electrical and Related Properties of Organic Solids (ERPOS-8) - Szklarska Poreba, Pol Duration: 26 Jun 1999 → 30 Jun 1999

Bibliographical note

Funding Information:
This work has been partially supported by the French Ministry of Foreign Affairs and the APAPE (France) and the Ministry of Sciences and Arts (Israel) within the Arc-En-Ciel/Keshet collaboration program. We wish to thank the French Embassy in Tel-Aviv for their kind help in arranging the collaboration between the French and the Israeli partners.

Funding

This work has been partially supported by the French Ministry of Foreign Affairs and the APAPE (France) and the Ministry of Sciences and Arts (Israel) within the Arc-En-Ciel/Keshet collaboration program. We wish to thank the French Embassy in Tel-Aviv for their kind help in arranging the collaboration between the French and the Israeli partners.

Funders
Ministry of Sciences and Arts
Ministère des Affaires Etrangères

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10.1016/s0379-6779(99)00198-8

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@article{6cdfc5c11417467d90ae95b82d74fc42,

title = "Atomic force microscopy study of the morphology of polythiophene films grafted onto the surface of a Pt microelectrode array",

abstract = "This work involves the application of atomic force microscopy (AFM) to the study of the morphology of polythiophene (PT) films grafted onto an array of six-band microelectrodes used for the measurements of in situ electronic conductivity of polymeric films. The following two types of the polymeric film can be distinguished: one film is related to the layer just above the microelectrodes, whereas the other type of film bridges the gap between the two microelectrodes. We have shown that the gaps located in the interior part of the array are completely bridged by the PT film; however, the thickness of the film above the microelectrodes is about one order of magnitude larger than that related to the center of the gap. The Z-profile of the film across the gap has a rounded shape. The lateral (friction) force image taken from both types of the PT films shows that they are similar. The AFM images prove that the PT film possesses mainly a granular-type morphology.",

author = "Levi, \{M. D.\} and Yaron Cohen and Yair Cohen and Doron Aurbach and M. Lapkowski and E. Vieil and J. Serose",

note = "Funding Information: This work has been partially supported by the French Ministry of Foreign Affairs and the APAPE (France) and the Ministry of Sciences and Arts (Israel) within the Arc-En-Ciel/Keshet collaboration program. We wish to thank the French Embassy in Tel-Aviv for their kind help in arranging the collaboration between the French and the Israeli partners.; The 18th International Conference on Electrical and Related Properties of Organic Solids (ERPOS-8) ; Conference date: 26-06-1999 Through 30-06-1999",

year = "2000",

month = mar,

day = "1",

doi = "10.1016/s0379-6779(99)00198-8",

language = "אנגלית",

volume = "109",

pages = "55--65",

journal = "Synthetic Metals",

issn = "0379-6779",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - Atomic force microscopy study of the morphology of polythiophene films grafted onto the surface of a Pt microelectrode array

AU - Levi, M. D.

AU - Cohen, Yaron

AU - Cohen, Yair

AU - Aurbach, Doron

AU - Lapkowski, M.

AU - Vieil, E.

AU - Serose, J.

N1 - Funding Information: This work has been partially supported by the French Ministry of Foreign Affairs and the APAPE (France) and the Ministry of Sciences and Arts (Israel) within the Arc-En-Ciel/Keshet collaboration program. We wish to thank the French Embassy in Tel-Aviv for their kind help in arranging the collaboration between the French and the Israeli partners.

PY - 2000/3/1

Y1 - 2000/3/1

N2 - This work involves the application of atomic force microscopy (AFM) to the study of the morphology of polythiophene (PT) films grafted onto an array of six-band microelectrodes used for the measurements of in situ electronic conductivity of polymeric films. The following two types of the polymeric film can be distinguished: one film is related to the layer just above the microelectrodes, whereas the other type of film bridges the gap between the two microelectrodes. We have shown that the gaps located in the interior part of the array are completely bridged by the PT film; however, the thickness of the film above the microelectrodes is about one order of magnitude larger than that related to the center of the gap. The Z-profile of the film across the gap has a rounded shape. The lateral (friction) force image taken from both types of the PT films shows that they are similar. The AFM images prove that the PT film possesses mainly a granular-type morphology.

AB - This work involves the application of atomic force microscopy (AFM) to the study of the morphology of polythiophene (PT) films grafted onto an array of six-band microelectrodes used for the measurements of in situ electronic conductivity of polymeric films. The following two types of the polymeric film can be distinguished: one film is related to the layer just above the microelectrodes, whereas the other type of film bridges the gap between the two microelectrodes. We have shown that the gaps located in the interior part of the array are completely bridged by the PT film; however, the thickness of the film above the microelectrodes is about one order of magnitude larger than that related to the center of the gap. The Z-profile of the film across the gap has a rounded shape. The lateral (friction) force image taken from both types of the PT films shows that they are similar. The AFM images prove that the PT film possesses mainly a granular-type morphology.

UR - https://www.scopus.com/pages/publications/0033892367

U2 - 10.1016/s0379-6779(99)00198-8

DO - 10.1016/s0379-6779(99)00198-8

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:0033892367

SN - 0379-6779

VL - 109

SP - 55

EP - 65

JO - Synthetic Metals

JF - Synthetic Metals

IS - 1

T2 - The 18th International Conference on Electrical and Related Properties of Organic Solids (ERPOS-8)

Y2 - 26 June 1999 through 30 June 1999

ER -

Atomic force microscopy study of the morphology of polythiophene films grafted onto the surface of a Pt microelectrode array

Abstract

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