Fingerprint
Dive into the research topics of 'Assessment of attachment in psychosis: A psychometric cause for concern'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Assessment of attachment in psychosis: A psychometric cause for concern
Charles M. Olbert, David L. Penn, Steven P. Reise, William P. Horan, Robert S. Kern, Junghee Lee, Michael F. Green
Research output: Contribution to journal › Article › peer-review
18
Scopus
citations