Anomalous Expansion of CeO2 Nanocrystalline Membranes

Jaya P. Nair; Ellen Wachtel; Igor Lubomirsky; Juergen Fleig; Joachim Maier

doi:10.1002/adma.200305549

Anomalous Expansion of CeO₂ Nanocrystalline Membranes

Jaya P. Nair
, Ellen Wachtel
, Igor Lubomirsky
, Juergen Fleig
, Joachim Maier

Weizmann Institute of Science
Max Planck Institute for Solid State Research

Research output: Contribution to journal › Article › peer-review

92 Scopus citations

Abstract

The mechanical and chemical processes occurring in undoped nanocrystalline CeO₂ membranes due to order-disorder transition of oxygen vacancies were analyzed. 1.5±0.2 μm thick CeO₂ films were deposited by radio frequency (RF) magnetron plasma sputtering on silicon. The nanocrystalline membranes were studied using x-ray diffraction analysis (XRD) and scanning electron microscopy (SEM). It was found that the order-disorder transition led to a large lateral expansion and buckling of the membranes.

Original language	English
Pages (from-to)	2077-2081
Number of pages	5
Journal	Advanced Materials
Volume	15
Issue number	24
DOIs	https://doi.org/10.1002/adma.200305549
State	Published - 17 Dec 2003
Externally published	Yes

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abstract = "The mechanical and chemical processes occurring in undoped nanocrystalline CeO2 membranes due to order-disorder transition of oxygen vacancies were analyzed. 1.5±0.2 μm thick CeO2 films were deposited by radio frequency (RF) magnetron plasma sputtering on silicon. The nanocrystalline membranes were studied using x-ray diffraction analysis (XRD) and scanning electron microscopy (SEM). It was found that the order-disorder transition led to a large lateral expansion and buckling of the membranes.",

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AU - Nair, Jaya P.

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AU - Maier, Joachim

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N2 - The mechanical and chemical processes occurring in undoped nanocrystalline CeO2 membranes due to order-disorder transition of oxygen vacancies were analyzed. 1.5±0.2 μm thick CeO2 films were deposited by radio frequency (RF) magnetron plasma sputtering on silicon. The nanocrystalline membranes were studied using x-ray diffraction analysis (XRD) and scanning electron microscopy (SEM). It was found that the order-disorder transition led to a large lateral expansion and buckling of the membranes.

AB - The mechanical and chemical processes occurring in undoped nanocrystalline CeO2 membranes due to order-disorder transition of oxygen vacancies were analyzed. 1.5±0.2 μm thick CeO2 films were deposited by radio frequency (RF) magnetron plasma sputtering on silicon. The nanocrystalline membranes were studied using x-ray diffraction analysis (XRD) and scanning electron microscopy (SEM). It was found that the order-disorder transition led to a large lateral expansion and buckling of the membranes.

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Anomalous Expansion of CeO₂ Nanocrystalline Membranes

Abstract

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