Anisotropic percolation and the d-dimensional surface roughening problem

Sergey V. Buldyrev; Shlomo Havlin; H. Eugene Stanley

doi:10.1016/0378-4371(93)90518-9

Anisotropic percolation and the d-dimensional surface roughening problem

Sergey V. Buldyrev
, Shlomo Havlin
, H. Eugene Stanley

Department of Physics - at Bar-Ilan University

Boston University

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

Abstract

We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.

Original language	English
Pages (from-to)	200-211
Number of pages	12
Journal	Physica A: Statistical Mechanics and its Applications
Volume	200
Issue number	1-4
DOIs	https://doi.org/10.1016/0378-4371(93)90518-9
State	Published - 15 Nov 1993

Bibliographical note

Funding Information:
We wish to thank T. Vicsek, A.L. Barabasi and G. Huber for helpful discussions,J . KertCsz for stimulatingc ollaborations on some of the ideas presentedh ere, D. Kessler for critical commentso n the manuscript,a nd NSF for financial support.

Funding

We wish to thank T. Vicsek, A.L. Barabasi and G. Huber for helpful discussions,J . KertCsz for stimulatingc ollaborations on some of the ideas presentedh ere, D. Kessler for critical commentso n the manuscript,a nd NSF for financial support.

Funders
National Science Foundation

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10.1016/0378-4371(93)90518-9

Cite this

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title = "Anisotropic percolation and the d-dimensional surface roughening problem",

abstract = "We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.",

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N2 - We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.

AB - We review recent numerical simulations of several models of interface growth in d-dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent δ=0.63±0.01 (d=1+1) and δ=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. The values of δ in higher dimensions (δ=0.38±0.03 in d=4 and δ=0.27±0.05 in d=5) do not support a recent theoretical conjecture.

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Anisotropic percolation and the d-dimensional surface roughening problem

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