ANALYTICAL ELECTRON MICROSCOPY USING EXTENDED ENERGY LOSS FINE STRUCTURE (EXELFS).

On the high energy side of an absorption edge, modulations occur in the differential inelastic electron scattering cross-section. These modulations are called EXELFS (Extended Energy Loss Fine Structure). It may be shown that EXELFS contain the same kind of information as the more commonly known EXAFS (Extended X-ray Absorption Fine Structure). In this review article, experimental work to date is summarized and the feasibility of the EXELFS technique is discussed with particular emphasis on some of its unique features.