Analytic outlier removal in line fitting

Nathan S. Netanyahu, Isaac Weiss

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The conventional ordinary least squares (OLS) method of fitting a. line to a set of data points is notoriously unreliable when the amount of random noise in the input (such as an image) is significant compared with the amount of data that is correlated with the line itself. Although points which lie far away from the line (i.e., outliers) are usually only to noise, they contribute the most to the squared distances, thereby skewing the line estimate from its correct position. In this paper we present an analytic method of separating the data of interest from the outliers. We assume that the overall data (i.e., the line data plus the noise) can be modeled as a mixture of two statistical distributions. Applying a variant of the method of moments (MoM) to the assumed model yields an analytic estimate of the desired line. Key words: Line fitting, outliers, noise removal, mixture models, method of moments.

Original languageEnglish
Title of host publicationProceedings of the 12th IAPR International Conference on Pattern Recognition - Conference B
Subtitle of host publicationPattern Recognition and Neural Networks, ICPR 1994
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages406-408
Number of pages3
ISBN (Electronic)0818662700
StatePublished - 1994
Externally publishedYes
Event12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994 - Jerusalem, Israel
Duration: 9 Oct 199413 Oct 1994

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume2
ISSN (Print)1051-4651

Conference

Conference12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994
Country/TerritoryIsrael
CityJerusalem
Period9/10/9413/10/94

Bibliographical note

Publisher Copyright:
© 1994 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

Fingerprint

Dive into the research topics of 'Analytic outlier removal in line fitting'. Together they form a unique fingerprint.

Cite this