Analysis of the surface chemical structure of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate using XPS and ToF-SIMS

S. R. Leadley; M. C. Davies; A. Domb; R. Nudelman; A. J. Paul; G. Beamson

doi:10.1021/ma960981t

Analysis of the surface chemical structure of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate using XPS and ToF-SIMS

S. R. Leadley, M. C. Davies, A. Domb, R. Nudelman, A. J. Paul, G. Beamson

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

X-ray photoelectron spectrocopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been used to characterize the surface chemistry of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate, ToF-SIMS analysis yielded fragmentation patterns consisting of ions diagnostic of both monomers. Across the copolymer series, relative peak intensities of these diagnostic ions showed a good comparison between surface and bulk composition, in accordance with the XPS analysis. ToF-SIMS data also indicated that these copolymers consisted of either random or block sections.

Original language	English
Pages (from-to)	8957-8965
Number of pages	9
Journal	Macromolecules
Volume	31
Issue number	25
DOIs	https://doi.org/10.1021/ma960981t
State	Published - 15 Dec 1998
Externally published	Yes

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abstract = "X-ray photoelectron spectrocopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been used to characterize the surface chemistry of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate, ToF-SIMS analysis yielded fragmentation patterns consisting of ions diagnostic of both monomers. Across the copolymer series, relative peak intensities of these diagnostic ions showed a good comparison between surface and bulk composition, in accordance with the XPS analysis. ToF-SIMS data also indicated that these copolymers consisted of either random or block sections.",

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AU - Leadley, S. R.

AU - Davies, M. C.

AU - Domb, A.

AU - Nudelman, R.

AU - Paul, A. J.

AU - Beamson, G.

PY - 1998/12/15

Y1 - 1998/12/15

N2 - X-ray photoelectron spectrocopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been used to characterize the surface chemistry of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate, ToF-SIMS analysis yielded fragmentation patterns consisting of ions diagnostic of both monomers. Across the copolymer series, relative peak intensities of these diagnostic ions showed a good comparison between surface and bulk composition, in accordance with the XPS analysis. ToF-SIMS data also indicated that these copolymers consisted of either random or block sections.

AB - X-ray photoelectron spectrocopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been used to characterize the surface chemistry of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate, ToF-SIMS analysis yielded fragmentation patterns consisting of ions diagnostic of both monomers. Across the copolymer series, relative peak intensities of these diagnostic ions showed a good comparison between surface and bulk composition, in accordance with the XPS analysis. ToF-SIMS data also indicated that these copolymers consisted of either random or block sections.

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JO - Macromolecules

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ER -

Analysis of the surface chemical structure of copolymers of poly(sebacic anhydride) with ricinoleic acid maleate using XPS and ToF-SIMS

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