Analysis of experimental extended x-ray-absorption fine-structure (EXAFS) data using calculated curved-wave, multiple-scattering EXAFS spectra

Jose Mustre, Yizhak Yacoby, Edward A. Stern, John J. Rehr

Research output: Contribution to journalArticlepeer-review

76 Scopus citations

Fingerprint

Dive into the research topics of 'Analysis of experimental extended x-ray-absorption fine-structure (EXAFS) data using calculated curved-wave, multiple-scattering EXAFS spectra'. Together they form a unique fingerprint.

Keyphrases

Chemistry

Physics

Engineering