An improved background removal method for XAFS

Matthew Newville, Peteris Līvinš, Yitzhak Yacoby, John J. Rehr, Edward A. Stern

Research output: Contribution to journalArticlepeer-review

16 Scopus citations


A new technique for separating the background, µ0, from the XAFS, χ, is presented and shown to be an improvement to standard background removal methods, especially in the near-edge region. The technique optimizes the low-R components of χ(R) For a calculated absorption spectrum for pure Ti, the µ0 found by the presented technique agrees well with the calculated background function. For pure Pb, the extracted µ0 is shown to be nearly the same as that measured from the temperature dependence of the full absorption spectrum starting at an energy in the absorption edge. The reliability of the background from the new method at low-k values allows more information from the XAFS spectra to be used and provides an opportunity for sensitive tests of theoretical calculations in the near-edge region.

Original languageEnglish
Pages (from-to)125-127
Number of pages3
JournalJapanese Journal of Applied Physics
StatePublished - Jan 1993
Externally publishedYes


  • Background
  • Information content
  • XAFS


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