All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

Zeev Zalevsky, Javier García

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

In this paper, we present a novel approach which allows combining super resolved imaging with extended depth of focus while the result is obtained by all-optical means and no digital processing is required. The presented approach for the super resolved imaging includes attaching a random pinhole array plate to the aperture plane of the imaging system. The energetic efficiency of the system is high and it is much larger than an imaging through a single pinhole which also has extended depth of focus. The super resolving result is obtained by mechanic scanning of the aperture plane with the random plate.

Original languageEnglish
Pages (from-to)953-957
Number of pages5
JournalOptics Communications
Volume281
Issue number5
DOIs
StatePublished - 1 Mar 2008

Bibliographical note

Funding Information:
This work was supported by FEDER funds and the Spanish Ministerio de Educación y Ciencia under the Project FIS2007-60626.

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