All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

Zeev Zalevsky; Javier García

doi:10.1016/j.optcom.2007.10.065

All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

Zeev Zalevsky, Javier García

University of Valencia

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

In this paper, we present a novel approach which allows combining super resolved imaging with extended depth of focus while the result is obtained by all-optical means and no digital processing is required. The presented approach for the super resolved imaging includes attaching a random pinhole array plate to the aperture plane of the imaging system. The energetic efficiency of the system is high and it is much larger than an imaging through a single pinhole which also has extended depth of focus. The super resolving result is obtained by mechanic scanning of the aperture plane with the random plate.

Original language	English
Pages (from-to)	953-957
Number of pages	5
Journal	Optics Communications
Volume	281
Issue number	5
DOIs	https://doi.org/10.1016/j.optcom.2007.10.065
State	Published - 1 Mar 2008

Bibliographical note

Funding Information:
This work was supported by FEDER funds and the Spanish Ministerio de Educación y Ciencia under the Project FIS2007-60626.

Funding

This work was supported by FEDER funds and the Spanish Ministerio de Educación y Ciencia under the Project FIS2007-60626.

Funders	Funder number
Spanish Ministerio de Educación y Ciencia	FIS2007-60626
European Regional Development Fund

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10.1016/j.optcom.2007.10.065

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abstract = "In this paper, we present a novel approach which allows combining super resolved imaging with extended depth of focus while the result is obtained by all-optical means and no digital processing is required. The presented approach for the super resolved imaging includes attaching a random pinhole array plate to the aperture plane of the imaging system. The energetic efficiency of the system is high and it is much larger than an imaging through a single pinhole which also has extended depth of focus. The super resolving result is obtained by mechanic scanning of the aperture plane with the random plate.",

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All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

Abstract

Bibliographical note

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