TY - JOUR
T1 - Aggregate structure in CuBSe2/Mo films (B=In,Ga)
T2 - Its relation to their electrical activity
AU - Margulis, Lev
AU - Hodes, Gary
AU - Jakubowicz, Abram
AU - Cahen, David
PY - 1989
Y1 - 1989
N2 - CuBSe2/Mo films of about 3 μm in thickness prepared on different substrates (Si single crystal, glass, alumina) by three-source evaporation have been investigated by electron and optical microscopic techniques: Scanning electron microscopy [including (EBIC) electron-beam-induced current mode], conventional transmission electron microscopy (TEM), and optical Nomarski microscopy. They show, on top of their well-known dense polycrystalline structure (≊1 μm average grain size), a more coarse "aggregate" structure with aggregate dimensions of 20-100 μm, depending on the substrate used. The aggregate boundaries are characterized by very poor EBIC collection efficiency. For samples on glass substrates, this structure, as detected in EBIC, correlates with deformation patterns of the Mo layer seen by Nomarski contrast when viewed through the glass side of the samples. Local electrical measurements made on small Schottky contacts reveal a correlation between the aggregate structure and the I-V characteristics. TEM studies show the presence of both cubic (sphalerite) and tetragonal (chalcopyrite) phases with very clear intergranular phase separation. In many of the grains, twinning was observed. Separate studies of the aggregate boundaries show them to be made up of very tiny crystallites (≊50 Å), apparently mixed with amorphous material. Some of these crystallites in the CuInSe 2 films are identified as CuSe and In2Se3 particles.
AB - CuBSe2/Mo films of about 3 μm in thickness prepared on different substrates (Si single crystal, glass, alumina) by three-source evaporation have been investigated by electron and optical microscopic techniques: Scanning electron microscopy [including (EBIC) electron-beam-induced current mode], conventional transmission electron microscopy (TEM), and optical Nomarski microscopy. They show, on top of their well-known dense polycrystalline structure (≊1 μm average grain size), a more coarse "aggregate" structure with aggregate dimensions of 20-100 μm, depending on the substrate used. The aggregate boundaries are characterized by very poor EBIC collection efficiency. For samples on glass substrates, this structure, as detected in EBIC, correlates with deformation patterns of the Mo layer seen by Nomarski contrast when viewed through the glass side of the samples. Local electrical measurements made on small Schottky contacts reveal a correlation between the aggregate structure and the I-V characteristics. TEM studies show the presence of both cubic (sphalerite) and tetragonal (chalcopyrite) phases with very clear intergranular phase separation. In many of the grains, twinning was observed. Separate studies of the aggregate boundaries show them to be made up of very tiny crystallites (≊50 Å), apparently mixed with amorphous material. Some of these crystallites in the CuInSe 2 films are identified as CuSe and In2Se3 particles.
UR - http://www.scopus.com/inward/record.url?scp=36549098000&partnerID=8YFLogxK
U2 - 10.1063/1.344084
DO - 10.1063/1.344084
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AN - SCOPUS:36549098000
SN - 0021-8979
VL - 66
SP - 3554
EP - 3559
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 8
ER -