Advances in ultrafast scanning tunneling microscopy

D. Botkin; J. Glass; D. S. Chemla; D. F. Ogletree; M. Salmeron; S. Weiss

doi:10.1063/1.117581

Advances in ultrafast scanning tunneling microscopy

D. Botkin, J. Glass, D. S. Chemla, D. F. Ogletree, M. Salmeron, S. Weiss

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Abstract

Time resolved tunnel current was measured over 4 orders of magnitude in separation between tip and sample using an ultrafast scanning tunneling microscope (USTM). These measurements reveal two distinct regimes for tip height dependence of the signal. In addition, we report 900 femtosecond temporal resolution with a sensitivity of 20 mV/√Hz in USTM measurements of voltage pulses on a coplanar transmission line, and we show that the microscope operates as a high impedance probe.

Original language	English
Pages (from-to)	1321-1323
Number of pages	3
Journal	Applied Physics Letters
Volume	69
Issue number	9
DOIs	https://doi.org/10.1063/1.117581
State	Published - 26 Aug 1996
Externally published	Yes

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AU - Weiss, S.

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Advances in ultrafast scanning tunneling microscopy

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