Advances in ultrafast scanning tunneling microscopy

D. Botkin, J. Glass, D. S. Chemla, D. F. Ogletree, M. Salmeron, S. Weiss

Research output: Contribution to journalArticlepeer-review

46 Scopus citations


Time resolved tunnel current was measured over 4 orders of magnitude in separation between tip and sample using an ultrafast scanning tunneling microscope (USTM). These measurements reveal two distinct regimes for tip height dependence of the signal. In addition, we report 900 femtosecond temporal resolution with a sensitivity of 20 mV/√Hz in USTM measurements of voltage pulses on a coplanar transmission line, and we show that the microscope operates as a high impedance probe.

Original languageEnglish
Pages (from-to)1321-1323
Number of pages3
JournalApplied Physics Letters
Issue number9
StatePublished - 26 Aug 1996
Externally publishedYes


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