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Advanced surface probing using a dual-mode NSOM–AFM silicon-based photosensor
Matityahu Karelits
, Emanuel Lozitsky
, Avraham Chelly
,
Zeev Zalevsky
, Avi Karsenty
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
BINA Research Center - Nano-Photonics
Electro-Optics (BIU Engineering)
Bar-Ilan University - Alexander Kofkin Faculty of Engineering
Lev Academic Center
Research output
:
Contribution to journal
›
Article
›
peer-review
9
Scopus citations
Overview
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Keyphrases
Silicon-based
100%
Atomic Force Microscope
100%
Near-field Scanning Optical Microscope
100%
Dual-mode
100%
Advanced Surfaces
100%
Photosensor
100%
Photodetector
100%
Nanotechnology
50%
Surface Characterization
50%
Imaging Capability
50%
Collection Method
50%
Measurement Simulation
50%
Reflected Light
50%
Feasibility Analysis
50%
Visible Spectrum
50%
Simple Fabrication
50%
Atomic Force Microscope Tips
50%
Atomic Force Microscope Cantilever
50%
Silicon Cantilever
50%
Subwavelength Aperture
50%
Light Collection
50%
Atomic Force Microscope Imaging
50%
Combination Device
50%
Microscope Measurement
50%
Simulation Computation
50%
Commercial Silicon
50%
Material Science
Silicon
100%
Photosensor
100%
Dual-Mode
100%
Surface Characterization
33%
Physics
Nanotechnology
100%
Reflected Light
100%
Photoelectricity
100%