Advanced surface probing using a dual-mode NSOM–AFM silicon-based photosensor

Keyphrases

• Photodetector 100%
• Silicon-based 100%
• Atomic Force Microscope 100%
• Near-field Scanning Optical Microscope 100%
• Dual-mode 100%
• Advanced Surfaces 100%
• Photosensor 100%
• Nanotechnology 50%
• Surface Characterization 50%
• Imaging Capability 50%
• Collection Method 50%
• Measurement Simulation 50%
• Reflected Light 50%
• Feasibility Analysis 50%
• Visible Spectrum 50%
• Atomic Force Microscope Tips 50%
• Atomic Force Microscope Cantilever 50%
• Silicon Cantilever 50%
• Subwavelength Aperture 50%
• Light Collection 50%
• Atomic Force Microscope Imaging 50%
• Simple Fabrication Process 50%
• Combination Device 50%
• Microscope Measurement 50%
• Simulation Computation 50%

Engineering

• Atomic Force Microscope 100%
• Photosensor 100%
• Photodetector 40%
• Optical Microscope 40%
• Reflected Light 20%
• Proof-of-Concept 20%
• Light Collection 20%
• Feasibility Study 20%