A subthreshold voltage reference with coarse-fine voltage trimming

David Zagouri, Joseph Shor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper presents a self-biased subthreshold voltage reference with several types of trimming options. A current trim is used to achieve similar currents across process corners. A coarse/fine voltage trim was implemented, which utilized different Vth's of the process as well as the reverse short-channel effect. The range of voltages obtained vary from 86mV to 536mV with steps of 16mV. The circuit was designed in a standard 0.18 μm CMOS process. Simulation results at Vcc=1V shows a temperature coefficient (TC) between 40 to 400 ppm/oC at different trims over a 120oC range. The nominal power consumption was 1.35nW with a highly compact area of 0.002

Original languageEnglish
Title of host publication2021 IEEE International Symposium on Circuits and Systems, ISCAS 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728192017
DOIs
StatePublished - 2021
Event53rd IEEE International Symposium on Circuits and Systems, ISCAS 2021 - Daegu, Korea, Republic of
Duration: 22 May 202128 May 2021

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2021-May
ISSN (Print)0271-4310

Conference

Conference53rd IEEE International Symposium on Circuits and Systems, ISCAS 2021
Country/TerritoryKorea, Republic of
CityDaegu
Period22/05/2128/05/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE

Keywords

  • Analog design
  • CMOS
  • Reference voltages

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