Abstract
Biomedical systems often require several kb of embedded memory and are typically operated in the subthreshold (sub-VT) domain for good energy-efficiency. Embedded memories and their leakage current can easily dominate the overall silicon area and the total power consumption, respectively. Gain-cell based embedded DRAM arrays provide a high-density, low-leakage alternative to SRAM for such systems; however, they are typically designed for operation at nominal or only slightly scaled supply voltages. For the first time, this paper presents a gain-cell array which is fully functional in the sub-VT regime and achieves a data retention time that is more than 104 times higher than the access time. Monte Carlos simulations show that the 2 kb gain-cell array, implemented in a mature 0.18μm CMOS node and supplied with a sub-VT voltage of 400mV, exhibits robust write and read operations at 500 kHz under parametric variations and has over 99% availibilty for read and write access.
| Original language | American English |
|---|---|
| Title of host publication | Subthreshold Microelectronics Conference (SubVT) |
| Publisher | IEEE |
| State | Published - 2012 |
Bibliographical note
Place of conference:USAUN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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