A novel technique for RTP annealing of compound semiconductors

M. Fu, V. Sarvepalli, R. K. Singh, C. R. Abernathy, X. Cao, S. J. Pearton, J. A. Sekhar

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We introduce for the first time a novel rapid thermal processing (RTP) unit called Zapper™, which has recently been developed by MHI Inc. and the University of Florida, for high temperature thermal processing of semiconductors. This Zapper™ unit is capable of reaching much higher temperatures (>1500°C) than conventional tungsten-halogen lamp RTP equipment and achieving high ramp-up and ramp-down rates. We have conducted implant activation annealing studies of Si+-implanted GaN thin films (with and without an AlN encapsulation layer) using the Zapper™ unit at temperatures up to 1500°C. The electrical property measurements of such annealed samples have led to the conclusion that high annealing temperatures and AlN encapsulation are needed for the optimum activation efficiency of Si+ implants in GaN. It has clearly been demonstrated that the Zapper™ unit has tremendous potential for RTP annealing of semiconductor materials, especially for wide band-gap (WBG) compound semiconductors that require very high processing temperatures.

Original languageEnglish
Pages (from-to)2335-2340
Number of pages6
JournalSolid-State Electronics
Volume42
Issue number12
DOIs
StatePublished - Dec 1998
Externally publishedYes

Funding

This work is partially supported by the Ballistic Missile Defense Organization (BMDO) of the U.S. Department of Defense through the SBIR program under Contract No. F19628-97-C-0092. Dr. Joseph Lorenzo is the contract monitor. MHI funding of the University of Florida effort is gratefully acknowledged.

FundersFunder number
Ballistic Missile Defense Organization
U.S. Department of Defense
Small Business Innovation ResearchF19628-97-C-0092

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