Abstract
We introduce for the first time a novel rapid thermal processing (RTP) unit called Zapper™, which has recently been developed by MHI Inc. and the University of Florida, for high temperature thermal processing of semiconductors. This Zapper™ unit is capable of reaching much higher temperatures (>1500°C) than conventional tungsten-halogen lamp RTP equipment and achieving high ramp-up and ramp-down rates. We have conducted implant activation annealing studies of Si+-implanted GaN thin films (with and without an AlN encapsulation layer) using the Zapper™ unit at temperatures up to 1500°C. The electrical property measurements of such annealed samples have led to the conclusion that high annealing temperatures and AlN encapsulation are needed for the optimum activation efficiency of Si+ implants in GaN. It has clearly been demonstrated that the Zapper™ unit has tremendous potential for RTP annealing of semiconductor materials, especially for wide band-gap (WBG) compound semiconductors that require very high processing temperatures.
Original language | English |
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Pages (from-to) | 2335-2340 |
Number of pages | 6 |
Journal | Solid-State Electronics |
Volume | 42 |
Issue number | 12 |
DOIs | |
State | Published - Dec 1998 |
Externally published | Yes |
Funding
This work is partially supported by the Ballistic Missile Defense Organization (BMDO) of the U.S. Department of Defense through the SBIR program under Contract No. F19628-97-C-0092. Dr. Joseph Lorenzo is the contract monitor. MHI funding of the University of Florida effort is gratefully acknowledged.
Funders | Funder number |
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Ballistic Missile Defense Organization | |
U.S. Department of Defense | |
Small Business Innovation Research | F19628-97-C-0092 |