A method to improve reliability in a 65-nm SRAM PUF array

Yizhak Shifman; Avi Miller; Osnat Keren; Yoav Weizmann; Joseph Shor

doi:10.1109/lssc.2018.2879216

A method to improve reliability in a 65-nm SRAM PUF array

Yizhak Shifman, Avi Miller, Osnat Keren, Yoav Weizmann, Joseph Shor

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

A modified weak SRAM physical unclonable function (PUF) is proposed which is much more reliable than prior-art SRAM PUFs. The proposed PUF was fabricated in TSMC 65-nm process. A novel preselection test was run on these PUF arrays and is shown to eliminate all of the unstable cells (20%-25%). This PUF can drastically reduce the need for error correction codes. In addition, the preselection test can be accomplished in one VDD/temperature corner, which reduces the testing cost of finding unstable bits across many such corners, as is done in the prior art.

Original language	English
Article number	8519616
Pages (from-to)	138-141
Number of pages	4
Journal	IEEE Solid-State Circuits Letters
Volume	1
Issue number	6
DOIs	https://doi.org/10.1109/lssc.2018.2879216
State	Published - 2018

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

Physical unclonable function (PUF)
SRAM
preselection

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10.1109/lssc.2018.2879216

Cite this

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abstract = "A modified weak SRAM physical unclonable function (PUF) is proposed which is much more reliable than prior-art SRAM PUFs. The proposed PUF was fabricated in TSMC 65-nm process. A novel preselection test was run on these PUF arrays and is shown to eliminate all of the unstable cells (20%-25%). This PUF can drastically reduce the need for error correction codes. In addition, the preselection test can be accomplished in one VDD/temperature corner, which reduces the testing cost of finding unstable bits across many such corners, as is done in the prior art.",

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AU - Shor, Joseph

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A method to improve reliability in a 65-nm SRAM PUF array

Abstract

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Keywords

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