Abstract
A one-step process for copper nanopatterning on a silicon surface is reported. The patterns were formed by selective copper electroless deposition from a diluted HF/Cu2+ solution on defect sites on the silicon surfaces introduced by nanomechanical scratching. Field emission scanning electron microscopy and energy dispersive X-ray spectroscopy analyses show that copper particles were deposited preferentially on well-defined defect sites with high selectivity. The experiment demonstrated here shows a new one-step approach for metallic nanopatterning formation on a silicon surface.
| Original language | English |
|---|---|
| Pages (from-to) | C563-C565 |
| Journal | Journal of the Electrochemical Society |
| Volume | 150 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2003 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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