A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10

Avi Miller; Yizhak Shifman; Yoav Weizman; Osnat Keren; Joseph Shor

doi:10.1109/CICC.2019.8780246

A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10

Avi Miller, Yizhak Shifman, Yoav Weizman, Osnat Keren, Joseph Shor

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

14 Scopus citations

Abstract

An SRAM PUF with an internal error reduction mechanism is presented. A capacitive preselection test identifies potentially unstable cells with insufficient mismatch. The test can be accomplished in one VDD/temperature corner. An implementation in TSMC 65nm technology disqualified all the unstable cells (19.7%) in 14 800-bit arrays. The test has no impact on the randomness of the PUF and negligible impact on area. A highly competitive pre-ECC BER of 7.4E-10 and an energy consumption of 16fJ/bit were achieved.

Original language	English
Title of host publication	2019 IEEE Custom Integrated Circuits Conference, CICC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538693957
DOIs	https://doi.org/10.1109/CICC.2019.8780246
State	Published - Apr 2019
Event	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 - Austin, United States Duration: 14 Apr 2019 → 17 Apr 2019

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
Volume	2019-April
ISSN (Print)	0886-5930

Conference

Conference	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019
Country/Territory	United States
City	Austin
Period	14/04/19 → 17/04/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Funding

ACKNOWLEDGMENT This research was sponsored by the Israel Authority through the Kamin program. This research was sponsored by the Israel Innovation Authority through the Kamin program.

Funders	Funder number
Israel Innovation Authority
Israel National Road Safety Authority

Keywords

Hardware security
PUFs
preselection
style

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/CICC.2019.8780246

Cite this

Miller, A., Shifman, Y., Weizman, Y., Keren, O., & Shor, J. (2019). A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019 Article 8780246 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2019.8780246

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abstract = "An SRAM PUF with an internal error reduction mechanism is presented. A capacitive preselection test identifies potentially unstable cells with insufficient mismatch. The test can be accomplished in one VDD/temperature corner. An implementation in TSMC 65nm technology disqualified all the unstable cells (19.7\%) in 14 800-bit arrays. The test has no impact on the randomness of the PUF and negligible impact on area. A highly competitive pre-ECC BER of 7.4E-10 and an energy consumption of 16fJ/bit were achieved.",

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Miller, A, Shifman, Y, Weizman, Y, Keren, O & Shor, J 2019, A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10. in 2019 IEEE Custom Integrated Circuits Conference, CICC 2019., 8780246, Proceedings of the Custom Integrated Circuits Conference, vol. 2019-April, Institute of Electrical and Electronics Engineers Inc., 40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, United States, 14/04/19. https://doi.org/10.1109/CICC.2019.8780246

A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10. / Miller, Avi; Shifman, Yizhak; Weizman, Yoav et al.
2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8780246 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10

Abstract

Publication series

Conference

Bibliographical note

Funding

Keywords

UN SDGs

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