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A fast global shutter image sensor based on the VOD mechanism

  • Erez Tadmor
  • , Idan Bakish
  • , Shlomo Felzenshtein
  • , Eli Larry
  • , Giora Yahav
  • , David Cohen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

This paper presents a method to realize a fast and uniform global shutter for time resolved imaging in standard, commercially available image sensors. Fast toggling of the substrate voltage is used in image sensors with a Vertical Overflow Drain (VOD) shutter mechanism, a common building block of IT-CCDs. Special measurements and analysis techniques were developed in order to characterize the shutter performance. Results show very good performance, with various potential applications such as Time-of-Flight imaging, transient imaging, and Fluorescence Lifetime Imaging Microscopy. Using off-theshelf devices we were able to produce shutter rise and fall times of 1.5ns, and shutter contrast ratio of 1:50 or better. The global shutter temporal behavior is very uniform, with less than 200ps delay between the periphery and the center measured across 1/4" and 1/3" sensors. Moreover, neighboring pixels exhibit less than 50ps timing variation. The physical principles that allow this fast operation are discussed in detail and explained through measurement results supported by device simulations.

Original languageEnglish
Title of host publicationIEEE SENSORS 2014, Proceedings
EditorsFrancisco J. Arregui
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages618-621
Number of pages4
EditionDecember
ISBN (Electronic)9781479901616
DOIs
StatePublished - 12 Dec 2014
Externally publishedYes
Event13th IEEE SENSORS Conference, SENSORS 2014 - Valencia, Spain
Duration: 2 Nov 20145 Nov 2014

Publication series

NameProceedings of IEEE Sensors
NumberDecember
Volume2014-December
ISSN (Print)1930-0395
ISSN (Electronic)2168-9229

Conference

Conference13th IEEE SENSORS Conference, SENSORS 2014
Country/TerritorySpain
CityValencia
Period2/11/145/11/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

Keywords

  • Charge coupled device (CCD)
  • Fluorescence Lifetime Imaging Microscopy (FLIM)
  • Time resolved
  • Time-of-Flight (TOF)

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