TY - JOUR
T1 - A Fast-Gated CMOS Image Sensor with a Vertical Overflow Drain Shutter Mechanism
AU - Tadmor, Erez
AU - Lahav, Assaf
AU - Yahav, Giora
AU - Fish, Alexander
AU - Cohen, David
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - This paper presents a fast-gated CMOS image sensor (CIS) with a vertical overflow drain (VOD) shutter mechanism. The prototype imager includes two novel features: 1) the adaptation of the VOD shutter structure into a 0.18-μm CIS process and 2) the application of the VOD shutter for the purposes of time-resolved imaging with down to 5-ns pulsewidth. A 360-pixel × 180-pixel array with several 5.4-μm × 5.4-μm pixel types was implemented and tested, demonstrating 2-ns shutter rise/fall times and the 1:20 shutter contrast ratio for 850-nm pulsed illumination. These parameters, together with the uniformity of the shutter and the large full-well capacity of the pixel, are on par with the state-of-the-art of indirect time-of-flight and time-resolved imagers. The device structure and the special mode of operation that enables a fast gating are studied through the TCAD simulations and experimental results. Important design features that affect the pixel performance are illustrated in detail.
AB - This paper presents a fast-gated CMOS image sensor (CIS) with a vertical overflow drain (VOD) shutter mechanism. The prototype imager includes two novel features: 1) the adaptation of the VOD shutter structure into a 0.18-μm CIS process and 2) the application of the VOD shutter for the purposes of time-resolved imaging with down to 5-ns pulsewidth. A 360-pixel × 180-pixel array with several 5.4-μm × 5.4-μm pixel types was implemented and tested, demonstrating 2-ns shutter rise/fall times and the 1:20 shutter contrast ratio for 850-nm pulsed illumination. These parameters, together with the uniformity of the shutter and the large full-well capacity of the pixel, are on par with the state-of-the-art of indirect time-of-flight and time-resolved imagers. The device structure and the special mode of operation that enables a fast gating are studied through the TCAD simulations and experimental results. Important design features that affect the pixel performance are illustrated in detail.
KW - CMOS image sensor (CIS)
KW - Time resolved
KW - Time-of-flight (TOF) imaging
UR - http://www.scopus.com/inward/record.url?scp=84959468887&partnerID=8YFLogxK
U2 - 10.1109/ted.2015.2443056
DO - 10.1109/ted.2015.2443056
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AN - SCOPUS:84959468887
SN - 0018-9383
VL - 63
SP - 138
EP - 144
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 1
M1 - 7131512
ER -