A deep neural network witharestricted noisy channel for identification of functional introns

Alan Joseph Bekker, Michal Chorev, Liran Carmel, Jacob Goldberger

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

An appreciable fraction of introns is thought to be involved in cellular functions, but there is no obvious way to predict which specific intron is likely to be functional. For each intron we are given a feature representation that is based on its evolutionary patterns. For a small subsets of introns we are also given an indication that they are functional. For all other introns it is not known whether they are functional or not. Our task is to estimate what fraction of introns are functional and, how likely it is that each individual intron is functional. We define a probabilistic classification model that treats the given functionality labels as noisy versions of labels created by a Deep Neural Network model. The maximum-likelihood model parameters are found by utilizing the Expectation-Maximization algorithm. We show that roughly 80% of the functional introns are still not recognized as such, and that roughly a third of all introns are functional.

Original languageEnglish
Title of host publication2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017 - Proceedings
EditorsNaonori Ueda, Jen-Tzung Chien, Tomoko Matsui, Jan Larsen, Shinji Watanabe
PublisherIEEE Computer Society
Pages1-6
Number of pages6
ISBN (Electronic)9781509063413
DOIs
StatePublished - 5 Dec 2017
Event2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017 - Tokyo, Japan
Duration: 25 Sep 201728 Sep 2017

Publication series

NameIEEE International Workshop on Machine Learning for Signal Processing, MLSP
Volume2017-September
ISSN (Print)2161-0363
ISSN (Electronic)2161-0371

Conference

Conference2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017
Country/TerritoryJapan
CityTokyo
Period25/09/1728/09/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • Intron function
  • Noisy labels
  • Semi-supervised
  • Uncertain labels

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