A Compact First-Order ΣΔ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process

Keyphrases

• First-order 100%
• CMOS Process 100%
• On-die 100%
• System-on-chip 100%
• Tri-gate 100%
• High-volume Testing 100%
• Digital CMOS 100%
• Intellectual Property 66%
• Compact Area 66%
• Test Coverage 33%
• Analog-to-digital Converter 33%
• Primary Design 33%
• Area Reduction 33%
• Common-mode Rejection Ratio 33%
• Single chip 33%
• Cycling Effect 33%
• Inverter-based 33%
• Pseudo-differential 33%
• Time-multiplexed 33%
• Design Focus 33%
• Conv 33%
• Voltage Measurement 33%
• Limit Cycling 33%

Computer Science

• Order Modulator 100%
• System-on-Chip 100%
• Complex System 100%
• Intellectual Property 100%
• System on a Chip 50%
• Analog-to-Digital Converter 50%
• single-chip 50%
• Test Coverage 50%